徐晴,纪峰,田正其,陈红芳,胡环.基于EEPROM 数据读写的智能电能表白盒测试方法[J].电测与仪表,2014,51(3):. XU Qing,Ji Feng,Tian Zheng-qi,Chen Hong-fang,Hu Huan.A New White Box Test Method Applying to Watt-hour Meter Based onReading and Writing EEPROM[J].Electrical Measurement & Instrumentation,2014,51(3):.
基于EEPROM 数据读写的智能电能表白盒测试方法
A New White Box Test Method Applying to Watt-hour Meter Based onReading and Writing EEPROM
Black box testing method for watt-hour meter cannot implementSbranch path traversal of theSwatt-hour meterSsoftware, and also can"t provide EEPROM data error tolerance evaluation of theSwatt-hour meter, meanwhile considering the facts that watt-hour meter data storage unit EEPROM preserved watt-hour meter"s running parameters, this paper proposesSa new type of watt-hour meter white-box testing methodSbased on EEPROM read and write .The new test method based on the reading and writing of the parameters in EEPROM, which can implement Sbranch path traversal of theSwatt-hour meter software, and avoid the branches path missing of the black box test.SAt the same time, the new test method can realize the watt-hour meter software fault tolerance evaluation.
