戴宪滨,孙文瑶,尹健.基于ARM微处理器和嵌入式系统的电能质量检测装置设计[J].电测与仪表,2014,51(18):. DAI Xian-bin,SUN Wen-yao,YIN Jian.Design of Power Quality Tests Device Based on ARM Microprocessor and Embedded System[J].Electrical Measurement & Instrumentation,2014,51(18):.
基于ARM微处理器和嵌入式系统的电能质量检测装置设计
Design of Power Quality Tests Device Based on ARM Microprocessor and Embedded System
This paper, according to the practical problems existing in the power system, based on the study of a large amount of power quality monitoring and analysis of similar products and makingSaSconcreteSanalysisSfurther, choosing the LPC2119 chip based on ARM7 as the main controller of this device and the AVR ATMEGA16 chip as the assistant controller, make the design scheme of power quality monitoring device with its own characteristics. The rationality of this scheme was verified based onStheSanalysisSofSexperiments.