鲍进,周超,田正其,纪峰,宋锡强,马粉莲,吴建国,丁发根.HALT高加速寿命试验在智能电能表可靠性中的应用[J].电测与仪表,2014,51(19):. BAO Jin,ZHOU Chao,TIAN Zheng-qi,JI Feng,Song xi-qiang,MA Fen-lian,WU Jian-guo,Ding Fa-gen.The High Accelerated Life Test In The Application Of The Smart Electricity Meter Reliability[J].Electrical Measurement & Instrumentation,2014,51(19):.
HALT高加速寿命试验在智能电能表可靠性中的应用
The High Accelerated Life Test In The Application Of The Smart Electricity Meter Reliability
It is difficult for the smart electricity meter as a bulk electronic product to achieve the inherent reliability level of original design after put into batch production, due to various reasons, such as raw materials, components and manufacturing process defects ,even sometimes far below it. Designing a reliable product in the shortest possible time to meet the needs of product time to market is a must.Therefore, in recent years some large international enterprises have a mindset to how to adopt the most rapid and effective method to find the product potential defect in the product development phase.Then high accelerated life test (HALT) is an effective method to find product defects in the shortest time. According to the practical application, through the related tests on mainstream smart electricity meter in the market, the results verified the test method was scientific and effective.Thereby hope high accelerated life test technology can be adopted and promoted in the smart electricity meter industry.