• HOME
  • About Journal
    • Historical evolution
    • Journal Honors
  • Editorial Board
    • Members of Committee
    • Director of the Committee
    • President and Editor in chief
  • Submission Guide
    • Instructions for Authors
    • Manuscript Processing Flow
    • Model Text
    • Procedures for Submission
  • Academic Influence
  • Open Access
  • Ethics&Policies
    • Publication Ethics Statement
    • Peer Review Process
    • Academic Misconduct Identification and Treatment
    • Advertising and Marketing
    • Correction and Retraction
    • Conflict of Interest
    • Authorship & Copyright
  • Contact Us
  • Chinese
Site search        
文章摘要
大功率SiC MOSFET驱动电路设计
The Design of High Power SiC MOSFET Driver Circuit
Received:April 25, 2014  Revised:July 05, 2014
DOI:
中文关键词: SiC MOSFET  开关特性  驱动电路  双脉冲实验
英文关键词: SiC MOSFET, Switching Characteristics, Drive circuit, Double-pulse experiment
基金项目:
Author NameAffiliationE-mail
PENG Yong-long School of Electrical and Electronic Engineering,North China Electric Power University 859943204@qq.com 
LI Rong-rong* School of Electrical and Electronic Engineering,North China Electric Power University 859943204@qq.com 
LI Ya-bin School of Electrical and Electronic Engineering,North China Electric Power University  
Hits: 3776
Download times: 2044
中文摘要:
      本文在实际工程应用的基础上,针对50KW/1MHz的高频感应加热大功率SiC MOSFET电路要求及SiC MOSFET开关特性进行开发研究。通过对SiC MOSFET的开通过程特性进行详细,得出使其可靠、安全驱动的要求,在现有已经成熟应用的Si MOSFET驱动电路基础上对其进行改进,研究适合工作在兆赫范围内的SiC MOSFET驱动电路。并采用双脉冲实验验证所设计驱动电路的基本特性及确定最佳门极电阻参数。
英文摘要:
      On the basis of project, one kind of driver circuit for SiC MOSFET was discussed according to the requirements of 50KW/1MHz high power SiC MOSFET circuit, and the switching characteristics of SiC MOSFET. Through the process of opening the detailed characteristics of SiC MOSFET , come to make reliable, safe driving requirements, to improve it in Si MOSFET driver circuit-based applications on existing mature, research for the job in the megahertz range of SiC MOSFET driver circuit . The basic characteristics of the driver circuit using double-pulse experiments to verify the design and determine the optimal parameters of the gate resistance.
View Full Text   View/Add Comment  Download reader
Close
  • Home
  • About Journal
    • Historical evolution
    • Journal Honors
  • Editorial Board
    • Members of Committee
    • Director of the Committee
    • President and Editor in chief
  • Submission Guide
    • Instructions for Authors
    • Manuscript Processing Flow
    • Model Text
    • Procedures for Submission
  • Academic Influence
  • Open Access
  • Ethics&Policies
    • Publication Ethics Statement
    • Peer Review Process
    • Academic Misconduct Identification and Treatment
    • Advertising and Marketing
    • Correction and Retraction
    • Conflict of Interest
    • Authorship & Copyright
  • Contact Us
  • 中文页面
Address: No.2000, Chuangxin Road, Songbei District, Harbin, China    Zip code: 150028
E-mail: dcyb@vip.163.com    Telephone: 0451-86611021
© 2012 Electrical Measurement & Instrumentation
黑ICP备11006624号-1
Support:Beijing Qinyun Technology Development Co., Ltd