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文章摘要
可选择型低值电容标准的研究
Research on a Selectable Low-value Capacitance Standard
Received:October 23, 2014  Revised:October 23, 2014
DOI:
中文关键词: 可选择型低值电容标准  3-D电场仿真  屏蔽栅  边缘效应
英文关键词: Selectable  Low-value  Capacitance Standard, 3-D  electrical simulation, Screen  shutter, Edge  effect
基金项目:国家自科科学青年基金项目
Author NameAffiliationE-mail
ZHANG Yan-li* College of Automation Engineering,Qingdao University zhangyanlisnail@163.com 
CHI Jie-ru College of Automation Engineering,Qingdao University  
HUANG Lu National Institute of Metrology huanglu@nim.ac.cn 
RAEDUK LEE National Institute of Metrology huanglu@nim.ac.cn 
QI Fu-qiang College of Automation Engineering,Qingdao University  
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中文摘要:
      在电磁计量和仪器仪表行业中,通常需要高稳定电容标准器装置对仪器设备进行量值检定校准以确保它们测量的准确性。可选择型低值电容就是一种可在同一系统中输出不同稳定微小电容值的标准器。针对该类电容器最大不确定度来源之一,即屏蔽栅通孔的边缘效应,本文采用3-D电场仿真对其进行了深入研究分析,同时依据仿真结果完成了一种可选择型低值电容器的整体结构设计,为其实际加工制作奠定了坚实的理论基础。
英文摘要:
      InSelectromagnetic metrologySandSelectronic instrumentation,Sthe stable capacitance standards including the Selectable Low-value Capacitance Standard(SLCS)are usually required for calibrating the instrumentations and meters. This paper adopts the 3-D electrical field simulation software to research on the edge effect around the hole on the screen shutter which is one of the largest uncertainty sources for the SLCS. On basis of the simulation results the overall mechanical structure for one kind of the SLCS has been designed, which can lay a strong foundation for its actual realization.
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