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文章摘要
某LED开关电源的高加速寿命试验(HALT)研究
Highly Accelerated Life Test (HALT) Research on a LED Switching Power Supply
Received:December 21, 2014  Revised:December 21, 2014
DOI:
中文关键词: LED开关电源  高加速寿命试验  失效判据  全轴随机振动
英文关键词: LED  switching power  supply, high  accelerated life  test, failure  criterion, Omni  axes random  vibration
基金项目:
Author NameAffiliationE-mail
YE Xue-rong* School of electrical engineering and automation,Harbin Institute of Technology xuelai1981@163.com 
LIU Gao-feng School of electrical engineering and automation,Harbin Institute of Technology  
SUN Bo School of electrical engineering and automation,Harbin Institute of Technology  
liumingwei Shanghai Customs College  
WANG Yi-xing School of electrical engineering and automation,Harbin Institute of Technology  
ZHAI Guo-fu School of electrical engineering and automation,Harbin Institute of Technology  
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中文摘要:
      LED作为新兴固态照明系统,其驱动电源的可靠性也引起了广泛的关注。高加速寿命试验作为可靠性强化试验,可以在较短时间内激发电子系统的故障模式。本文以某LED驱动用开关电源为对象,对其高加速寿命试验进行了研究。首先分析了该电源的基本结构与工作原理,确定其失效判据。设计了随机振动步进应力试验方案,得到该电子系统的可靠性薄弱环节,为其可靠性设计提供依据。
英文摘要:
      LED is a novel solid state lighting system, the reliability of whose driving power supply has attracted a wide attraction. As the reliability enhancement test, highly accelerated life test can excited the failure modes of the electronic system in a short period. This paper proposed a high accelerated life test with the LED switching power supply. Firstly, it analysed the basic structure and principle of the switching power supply. Then it determined the failure criterion. The paper also designed the random vibration step stress test plan and found the weak link reliability of the electronic system, which provided the basis for the reliability design.
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