• HOME
  • About Journal
    • Historical evolution
    • Journal Honors
  • Editorial Board
    • Members of Committee
    • Director of the Committee
    • President and Editor in chief
  • Submission Guide
    • Instructions for Authors
    • Manuscript Processing Flow
    • Model Text
    • Procedures for Submission
  • Academic Influence
  • Open Access
  • Ethics&Policies
    • Publication Ethics Statement
    • Peer Review Process
    • Academic Misconduct Identification and Treatment
    • Advertising and Marketing
    • Correction and Retraction
    • Conflict of Interest
    • Authorship & Copyright
  • Contact Us
  • Chinese
Site search        
文章摘要
基于Nand Flash 的BCH校验方法设计与实现
Design and Implementation of BCH verification Method Based on Nand Flash
Received:December 02, 2016  Revised:December 22, 2016
DOI:
中文关键词: BCH校验  并行编码  分块译码  FPGA  可靠性
英文关键词: BCH checking, parallel coding, block decoding, FPGA, reliability
基金项目:
Author NameAffiliationE-mail
shanyanhu north university of china 617149029@qq.com 
wuhuijun* north university of China 617149029@qq.com 
jiaoxinquan north university of China 617149029@qq.com 
qinfei north university of china 617149029@qq.com 
Hits: 1964
Download times: 1199
中文摘要:
      针对传统汉明码ECC校验方法纠错能力差的特点,结合Nand Flash 闪存内部组织结构,提出一种(4200,4096,8)的BCH码ECC校验方法。该方法采用并行编码方式,且对占用逻辑资源最多的译码器部分采用并行流水线分块译码,极大的提升了编译码效率。以FPGA为验证平台,通过大量数据读写表明,该方法大大提高了存储可靠性,为目前大容量存储提供了参考,具有较高的实用价值。
英文摘要:
      According to the internal structure of the nand flash memory and poor correct capability of traditional ECC of Hamming checking method, a kind of (4200,4096,8)BCH code for ECC verification is proposed. Parallel coding mode is chosen in this method. What’s more, parallel pipeline block decoding method is used for the decoder, which occupied most logical resource. With the method above, decoding efficiency is greatly increased. FPGA is selected as the verification platform, verification on this platform shows that the storage reliability is most significantly improved using BCH code for ECC verification. The proposed method has high practical value and reference for current large capacity storage is provided.
View Full Text   View/Add Comment  Download reader
Close
  • Home
  • About Journal
    • Historical evolution
    • Journal Honors
  • Editorial Board
    • Members of Committee
    • Director of the Committee
    • President and Editor in chief
  • Submission Guide
    • Instructions for Authors
    • Manuscript Processing Flow
    • Model Text
    • Procedures for Submission
  • Academic Influence
  • Open Access
  • Ethics&Policies
    • Publication Ethics Statement
    • Peer Review Process
    • Academic Misconduct Identification and Treatment
    • Advertising and Marketing
    • Correction and Retraction
    • Conflict of Interest
    • Authorship & Copyright
  • Contact Us
  • 中文页面
Address: No.2000, Chuangxin Road, Songbei District, Harbin, China    Zip code: 150028
E-mail: dcyb@vip.163.com    Telephone: 0451-86611021
© 2012 Electrical Measurement & Instrumentation
黑ICP备11006624号-1
Support:Beijing Qinyun Technology Development Co., Ltd