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文章摘要
基于改进的Sobel-Zernike矩法亚像素厚度测量
Subpixel thickness measurement based on improved Sobel-Zernike moment
Received:March 29, 2018  Revised:March 29, 2018
DOI:10.19753/j.issn1001-1390.2019.010.016
中文关键词: Sobel-Zernike矩法  亚像素  定位  厚度测量
英文关键词: Sobel-Zernike  moment, subpixel, location, thickness  measurement
基金项目:国家自然基金项目(61571106);江苏高校品牌专业建设工程资助项目(No.PPZY2015A092);江苏省“青蓝工程”骨干教师培养对象基金项目(苏教师﹝2017﹞15号)。
Author NameAffiliationE-mail
yangqianhua* Communication Institute of Nanjing College of Information Technology Communication Institute yangqh@njcit.cn 
yaoli School of Information Science and Engineering of Southeast University 114545577@qq.com 
zhaoli School of Information Science and Engineering of Southeast University 228616138@qq.com 
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中文摘要:
      针对Zernike矩亚像素定位算法精度较高,但算法运算时间较长的问题,提出基于Sobel的改进Zernike矩亚像素定位法,该算法通过Sobel检测初步定位护套和绝缘材料的边缘,缩小Zernike矩的计算范围,使得在精度基本不变的情况下,缩短了计算时间,提高了速度;并通过估计边缘点正态分布的均值将轮廓像素宽度缩小在单像素上,提高了算法的精度。通过将该算法与Zernike矩法以及插值法在精度和速度上的对比实验,验证了该算法的优越性,具有应用价值。
英文摘要:
      In view of the high precision of the Zernike moment subpixel location algorithm, but the algorithm has a long operation time, an improved Zernike moment subpixel location method based on Sobel is proposed. The algorithm detects the initial location of the sheath and the edge of the insulation material by Sobel, and reduces the computation range of the Zernike moments, so that the computation time is shortened and the speed is increased when the accuracy is basically unchanged.The accuracy of the algorithm is improved by reducing the width of the contour pixel on the single pixel by estimating the mean value of the normal distribution of the edge points.The superiority of the algorithm is verified by comparing the accuracy and speed of the improved Sobel-Zernike moment method, the common Zernike moment method and the improved interpolation method.
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