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文章摘要
一种基于FP-growth算法的变电站二次设备缺陷分析方法
A Kind of Defects Analysis Method for Substation Secondary Device using FP-growth Algorithm
Received:January 16, 2019  Revised:January 16, 2019
DOI:10.19753/j.issn1001-1390.2020.12.013
中文关键词: 二次设备  缺陷分析  关联规则  FP-growth算法
英文关键词: secondary  device, defect  analysis, association  rule, FP-growth
基金项目:国家自然科学基金资助项目(51677072);中央高校基本科研业务费专项资金资助项目(9160718005)
Author NameAffiliationE-mail
Xiao Yongli* State Grid Beijing Maintenance Company ylxiaoyl@163.com 
Liu Song Beijing Zhongtai Huadian Technology Co., Ltd linxidianliju@163.com 
Jian Wei Beijing Zhongtai Huadian Technology Co., Ltd jianwei@nsea.com.cn 
Song Yaqi School of Control and Computer, North China Electric Power University bdsyq@163.com 
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中文摘要:
      为提高监控人员面对设备海量缺陷信息的研判能力,丰富监控人员缺陷处理的技术手段,提出了一种基于FP-growth算法的变电站二次设备缺陷分析方法。利用关联规则挖掘的思想,为智能变电站二次设备建立缺陷模型,并利用FP-growth算法进行了缺陷数据的挖掘和分析,挖掘二次设备、缺陷和缺陷原因的关联规则。通过对国家电网公司真实缺陷数据分析,表明所提方法可以有效发现变电站、二次设备、缺陷性质、缺陷原因等因素之间的关联关系,为二次设备高效管控和运维提供有价值信息。
英文摘要:
      In order to improve the judgment ability to face huge amount of equipment defect information and enrich the technical means of defect processing, a method based on FP-growth algorithm for secondary equipment defect analysis in substation is proposed. A defect model is designed for secondary device and FP-growth algorithm is used to find the association rules for secondary device, defects and defect reasons. Through the analysis of the actual defect data of State Grid Corporation, it shows that the proposed method can effectively find the relationship among substation, secondary device, defect properties, defect causes and other factors, and provide valuable information for efficient control and operation of secondary device.
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