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文章摘要
级联MOSFET均压测试方法研究
Study on cascaded MOSFETs voltage-sharing test method
Received:September 23, 2020  Revised:September 24, 2020
DOI:10.19753/j.issn1001-1390.2024.01.031
中文关键词: 级联MOSFET  均压测试  高压开关  寄生参数
英文关键词: cascaded MOSFETs, voltage-sharing test, high-voltage switch, parasitic parameter
基金项目:国家自然科学基金资助项目(51777041);深圳市科技计划项目(JSGG20190823144607320);国家科技重大专项项目(2017ZX01013101-003)
Author NameAffiliationE-mail
FU Ming* 1. School of Astronautics, Harbin Institute of Technology, Harbin 150001, China. 2. Shenzhen Academy ofAerospace Technology, Shenzhen 518057, Guangdong , China. fm701zm@163.com 
WANG Zicai School of Astronautics, Harbin Institute of Technology, Harbin 150001, China. fm701zm@163.com 
ZHANG Hua 2. Shenzhen Academy ofAerospace Technology, Shenzhen 518057, Guangdong , China fm701zm@163.com 
ZHANG Donglai School of Mechanical Engineering and Automation, Harbin Institute of Technology ( Shenzhen) , Shenzhen 518055 , Guangdong, China fm701zm@163.com 
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中文摘要:
      文章分析了传统均压测试方法中,隔离高压探头寄生参数对级联MOSFET均压效果的影响。通过改变同一高边MOSFET的DS电压测试探头数量,分析了测试方法引入寄生参数的变化对瞬态均压的干扰程度。基于此提出了一种减法均压测试方法,并对所提出的减法均压测试方法的优化进行了分析与实验验证。实验结果表明该测试方式能精确评估级联MOSFET在稳态以及开通、关断瞬态的均压效果,且不受测试线缆寄生参数的影响。
英文摘要:
      In this paper, the influence of isolated high-voltage probe parasitic parameters on the cascaded MOSFETs voltage-sharing in traditional voltage-sharing test method is investigated. By changing the number of VDS measuring probes in the same high-side MOSFET, the interference degree of the parasitic parameters introduced into the test method to the transient voltage-sharing is analyzed. On this basis, a test method of voltage-sharing by subtraction is proposed, and its optimization is analyzed and verified by experiments. The experimental results show that the proposed method can accurately evaluate the voltage-sharing ffect of cascaded MOSFETs in steady state and ON/OFF transients , and it is not affeted by the parasitic parameters of the test cable.
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