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文章摘要
基于正态分布下视觉检测元器件的寿命预测
Life prediction of visual inspection components based on normal distribution
Received:July 30, 2019  Revised:July 30, 2019
DOI:10.19753/j.issn1001-1390.2021.05.024
中文关键词: 视觉检测元器件  加速模型  温度应力  寿命预测
英文关键词: visual inspection components, acceleration model, temperature stress, life prediction
基金项目:
Author NameAffiliationE-mail
Lliu Hao School of Mechanical Engineering, Guizhou University, Guiyang 550025, China 1073866795@qq.com 
He Fuqiang* School of Mechanical Engineering, Guizhou University, Guiyang 550025, China hefq75@163.com 
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中文摘要:
      针对视觉检测系统中电子元器件的寿命进行测试,实验发现温度的提升会直接影响其寿命大小。系统工作时不能有效地掌握元器件寿命的时长,导致系统故障将会严重影响正常工作,因此提出以恒定改变温度应力使元器件快速失效的方法。以点估计求得在正态分布下不同应力水平下的均值和方差的估计值,从而可以预测元器件在应力作用下的变化规律并选用加速模型进行拟合;采用假设检验的方法,对比检验方法和试验数据以验证假设及加速模型。实验结果表明:加速模型具有较高的精度,能够有效预测电子元器件在不同温度应力水平下的寿命;该方法在缩短寿命试验时间上表现很显著,试验效率也明显提高,使长寿命元器件的寿命预测评定成为可能,也为评估在正常温度应力下的元器件寿命预测提供理论依据。
英文摘要:
      n view of the testing of the lifetime of electronic components in visual inspection system, it is found that the increase of temperature will directly affect its life. When the system works, it cannot effectively grasp the long life of components, which will seriously affect the normal operation of the system. Therefore, a method of rapid failure of components by changing the temperature stress constant is proposed in this paper. The estimation of mean and variance under different stress levels under normal distribution are obtained by point estimation, which can predict the variation law of components under stress and select acceleration model to fit. Hypothesis testing method, comparison test method and test data are used to verify the hypothesis and accelerate the model. The experimental results show that the acceleration model has high accuracy and can effectively predict the lifetime of electronic components under different temperature stress levels. This method can shorten the life test time and improve the test efficiency, which makes it possible to predict and evaluate the life of long-life components. It also provides a theoretical basis for evaluating the life prediction of components under normal temperature stress.
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